Compact Image Dithering Stages Increase CCD Resolution

Description

Compact Image Dithering Stages Increase CCD Resolution

Nanopositioning specialist PI (Physik Instrumente) introduces the new
P-713/P-714, high-speed, XY-dithering stages for resolution enhancement and scanning applications.

These low-cost, piezo-driven stages feature a very high resonant frequency of 2.2 kHz for millisecond response. Ideal applications for the P-713 and P-714 are high-dynamics scanning and tracking tasks.

Integrated piezoelectric drives provide sub-nanometer resolution, important for high-resolution interlacing applications where the optical resolution of a CCD or CMOS sensor is increased by shifting it at high frequency between pixel positions.

The stages feature a very low profile of only 6 mm and can also be used in scanning microscopy applications or in static nanopositioning.

Application Examples
Resolution enhancement in imaging sensors; scanning microscopy; nanopositioning.

Features & Advantages
  • Very compact, only 45x45x6mm for easy integration
  • Low cost
  • Parallel-kinematics direct drive with 2.2 kHz resonant frequency for faster settling and higher scanning rates
  • Award-winning ceramic-encapsulated piezo-drives for longer lifetime
Control Electronics
A variety of standard and low-cost OEM controllers is available to drive these stages.

Specs

• Active axes - X, Y • Integrated sensor – SGS • Open-loop travel, -20 to +120 V – 20 • . Closed-loop travel – 15 • Open-loop resolution – 0.1 • Closed-loop resolution – 1 • Linearity – 0.3 • Repeatability – <4 • Pitch - yp. ±1max. ±5 • Yaw - typ. ±5 max. ±15 • Stiffness – 0.8 • Unloaded resonant frequency – 2250 • Ceramic type - PICMA® P-882 • Electrical capacitance in X , Y - 0.31 • Dynamic operating current coefficient (DOCC) in X, Y – 2.5 • Material - Stainless steel, ferromagnetic • Dimensions - 45 x 45 x 6
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