Benchtop Plating Measurement System Bowman’s G Series XRF is a robust system that’s ideally suited for the analysis of precious metals – also tin or nickel - on printed circuit boards, wafers,...
L Series XRF Measurement Systems Bowman has introduced its large component "L Series" XRF for parts measuring up to 22 X 24" X 13 in. The Bowman L Series desktop instrument was...
