Tomographic Imaging in Less Time


The new module for the ZEISS Xradia Versa 500-series of 3D X-ray microscopes (XRM) will allow users to acquire high quality images in one-quarter the time: ZEISS OptiRecon uses a new, advanced iterative reconstruction technique. Now you can make the optimal choice for your requirements: same quality images four times faster, or superior quality in the same amount of time as standard image acquisition.


Compared to other iterative reconstruction offerings, ZEISS OptiRecon is

  • Faster
  • More-efficient
  • More user-friendly


Other implementations require a complex cluster configuration to meet the computational demands of iterative reconstruction, and require extensive user expertise. ZEISS OptiRecon, a hardware/software module built on a single advanced workstation, offers a combination of a workflow-based user interface that doesn’t require knowledge of tomographic reconstruction algorithms, and an efficient proprietary implementation that allows reconstruction of a typical dataset in about three minutes.


This technology opens the door to 3D X-ray imaging, or computed tomography, to both a wider range of geological industry applications as well as the examination of in situ processes occurring at previously inaccessible timescales.


ZEISS OptiRecon is the most recent step ZEISS has taken to develop the ZEISS Xradia Versa system, introduced in 2010, with both hardware and software advancements to meet and exceed our users’ needs. As always, the system is available to existing users as a field upgrade, or can be purchased as an additional capability for ZEISS Xradia 510/520 Versa 3D X-ray microscopes.

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