TS 760 Touch Probe
Description
For use with contouring TNC and other major CNC controls, the TS 760 touch probe is distinguished by 3D machining accuracy, making it especially useful during 5-axis machining.
It features homogeneous switching behavior over 360-deg. and high accuracy (±1 µm). It also offers a fast feed rate/proving speed for 3D measurement and an ultra-low trigger force for eliminating form and surface damage.
The probing point can be cleaned with the integrated flusher feature by using compressed air and cooling lubricant of up to 60 bars.
The probe system uses a EnDat communication signal along with the SE 661 that offers a radio or infrared channel selection conveniently setup on the TNC screen.
Specs
- High probing accuracy of ±1 µm (with the T434 standard stylus)
- High probing reproducibility: 2 σ ≤ 0.25 µm
- Signal transmission: radio and infrared (at same time as tool touch probe)
- Minimal probing forces
- Interfaces: HTL or EnDat 2.2 (via transceiver)